Structural properties of CdO layers grown on GaAs (0 0 1) substrates by metalorganic molecular beam epitaxy

Transmission electron microscopy (TEM) and transmission electron diffraction (TED) examination has been made to investigate the microstructural behaviour of rock-salt CdO layers grown on (0 0 1) GaAs substrates with two different buffer layers of ZnS and ZnO/ZnS. It is shown that the CdO layer grown...

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Veröffentlicht in:Journal of crystal growth 2003-05, Vol.252 (1), p.219-225
Hauptverfasser: Kim, Bong-Joong, Ok, Y.-W., Seong, T.-Y., Ashrafi, A.B.M.A., Kumano, H., Suemune, I.
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Sprache:eng
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Zusammenfassung:Transmission electron microscopy (TEM) and transmission electron diffraction (TED) examination has been made to investigate the microstructural behaviour of rock-salt CdO layers grown on (0 0 1) GaAs substrates with two different buffer layers of ZnS and ZnO/ZnS. It is shown that the CdO layer grown on the ZnS buffer layer has epitaxial relationship to the GaAs substrate, even though a low density of CdO nano-crystallites (18–25 nm across) are formed at the CdO/ZnS interface region. TEM and TED results show that the CdO layer grown on the ZnO/ZnS buffer layer is polycrystalline. TED results also show that the ZnO buffer layer is polycrystalline with a mixture of wurtzite and zinc-blende phases, which results in the formation of polycrystalline CdO layers.
ISSN:0022-0248
1873-5002
DOI:10.1016/S0022-0248(02)02521-6