A structural study of effects of NiP seed layer on the magnetic properties of CoCrPt/Ti/NiP perpendicular magnetic films

A structural study of effects of NiP seed layer on the magnetic properties of CoCrPt/Ti/NiP perpendicular magnetic films

The CoCrPt/Ti/NiP films for perpendicular magnetic recording were studied using X-ray scattering and anomalous X-ray scattering. When the NiP seed layer was used, the long range order of the texture peak of the magnetic film decreased and less Co was associated with this Bragg order. The structural...

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Veröffentlicht in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2003, Vol.199 (Complete), p.156-160
Hauptverfasser: Sun, C.J., Chow, G.M., Wang, J.P., Soo, E.W., Noh, D.Y., Je, J.H., Hwu, Y.K.
Format: Artikel
Sprache:eng
Schlagworte:
EXAFS perpendicular magnetic recording
X-ray scattering
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Zusammenfassung:The CoCrPt/Ti/NiP films for perpendicular magnetic recording were studied using X-ray scattering and anomalous X-ray scattering. When the NiP seed layer was used, the long range order of the texture peak of the magnetic film decreased and less Co was associated with this Bragg order. The structural results were consistent with the observed increased coercivity and decreased magnetization due to the increased magnetic grain isolation caused by the presence of NiP seed layer.
ISSN:0168-583X
1872-9584
DOI:10.1016/S0168-583X(02)01393-9