A high-sensitivity CMOS image sensor with gain-adaptive column amplifiers

A high-sensitivity CMOS image sensor using gain-adaptive column amplifiers is presented and tested. The use of high gain for the column amplifier reduces input-referred random noise, and when coupled with a column-based digital noise cancellation technique, also reduces fixed pattern noise. An exper...

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Veröffentlicht in:	IEEE journal of solid-state circuits 2005-05, Vol.40 (5), p.1147-1156
Hauptverfasser:	Sakakibara, M., Kawahito, S., Handoko, D., Nakamura, N., Satoh, H., Higashi, M., Mabuchi, K., Sumi, H.
Format:	Artikel
Sprache:	eng
Schlagworte:	Amplifiers Applied sciences Circuit noise Circuit properties Circuits CMOS CMOS image sensors CMOS technology column amplifier Design. Technologies. Operation analysis. Testing Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology gain-adaptive amplifier High gain Image sensors Imaging devices Integrated circuits low readout noise Low-noise amplifiers Noise Noise cancellation Noise level Noise reduction Optoelectronic devices Photodiodes Random noise Semiconductor device noise Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Sensors
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Beschreibung
Zusammenfassung:	A high-sensitivity CMOS image sensor using gain-adaptive column amplifiers is presented and tested. The use of high gain for the column amplifier reduces input-referred random noise, and when coupled with a column-based digital noise cancellation technique, also reduces fixed pattern noise. An experimental application of the circuit using 0.25-/spl mu/m CMOS technology with pinned photodiodes gave an rms random noise of 263 /spl mu/V and an rms fixed pattern noise of 50 /spl mu/V.
ISSN:	0018-9200 1558-173X
DOI:	10.1109/JSSC.2005.845969