Structural classification of natural non-crystalline silicates

Using wide-angle X-ray diffraction measurements, atomic force microscopy and several physical properties of natural non-crystalline silicates, a structural classification can be derived. Qualitative differences in the intermediate range structure between tektites and relaxed tektites are found, but...

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Veröffentlicht in:Journal of non-crystalline solids 2003-08, Vol.323 (1), p.68-71
Hauptverfasser: Heide, G., Müller, B., Kloess, G., Moseler, D., Frischat, G.H.
Format: Artikel
Sprache:eng
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Zusammenfassung:Using wide-angle X-ray diffraction measurements, atomic force microscopy and several physical properties of natural non-crystalline silicates, a structural classification can be derived. Qualitative differences in the intermediate range structure between tektites and relaxed tektites are found, but strength changes with water content.
ISSN:0022-3093
1873-4812
DOI:10.1016/S0022-3093(03)00286-2