Structural classification of natural non-crystalline silicates
Using wide-angle X-ray diffraction measurements, atomic force microscopy and several physical properties of natural non-crystalline silicates, a structural classification can be derived. Qualitative differences in the intermediate range structure between tektites and relaxed tektites are found, but...
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Veröffentlicht in: | Journal of non-crystalline solids 2003-08, Vol.323 (1), p.68-71 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | Using wide-angle X-ray diffraction measurements, atomic force microscopy and several physical properties of natural non-crystalline silicates, a structural classification can be derived. Qualitative differences in the intermediate range structure between tektites and relaxed tektites are found, but strength changes with water content. |
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ISSN: | 0022-3093 1873-4812 |
DOI: | 10.1016/S0022-3093(03)00286-2 |