Extreme ultraviolet metalens by vacuum guiding

Extreme ultraviolet (EUV) radiation is a key technology for material science, attosecond metrology, and lithography. Here, we experimentally demonstrate metasurfaces as a superior way to focus EUV light. These devices exploit the fact that holes in a silicon membrane have a considerably larger refra...

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Veröffentlicht in:Science (American Association for the Advancement of Science) 2023-04, Vol.380 (6640), p.59-63
Hauptverfasser: Ossiander, Marcus, Meretska, Maryna Leonidivna, Hampel, Hana Kristin, Lim, Soon Wei Daniel, Knefz, Nico, Jauk, Thomas, Capasso, Federico, Schultze, Martin
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Sprache:eng
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Zusammenfassung:Extreme ultraviolet (EUV) radiation is a key technology for material science, attosecond metrology, and lithography. Here, we experimentally demonstrate metasurfaces as a superior way to focus EUV light. These devices exploit the fact that holes in a silicon membrane have a considerably larger refractive index than the surrounding material and efficiently vacuum-guide light with a wavelength of ~50 nanometers. This allows the transmission phase at the nanoscale to be controlled by the hole diameter. We fabricated an EUV metalens with a 10-millimeter focal length that supports numerical apertures of up to 0.05 and used it to focus ultrashort EUV light bursts generated by high-harmonic generation down to a 0.7-micrometer waist. Our approach introduces the vast light-shaping possibilities provided by dielectric metasurfaces to a spectral regime that lacks materials for transmissive optics.
ISSN:0036-8075
1095-9203
DOI:10.1126/science.adg6881