A stabilized resistive voltage source for FDTD thin-wire models

A stabilized resistive voltage source for FDTD thin-wire models

The von Neumann analysis is applied to investigate the stability of a source connected on a wire described by a thin-wire model. Both a soft source and a resistive voltage source (RVS) are shown to limit the stable range of values for wire radius or time step. Using the von Neumann analysis, a stabl...

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Veröffentlicht in:IEEE transactions on antennas and propagation 2003-07, Vol.51 (7), p.1615-1622
Hauptverfasser: Makinen, R.M., Kivikoski, M.A.
Format: Artikel
Sprache:eng
Schlagworte:
Antenna feeds
Antennas
Decay rate
Dielectric resonator antennas
Dipole antennas
Electric potential
Equations
Finite difference methods
Finite difference time domain method
Impedance
Mathematical models
Stability
Stability analysis
Time domain analysis
Voltage
Wire
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Beschreibung
Zusammenfassung:The von Neumann analysis is applied to investigate the stability of a source connected on a wire described by a thin-wire model. Both a soft source and a resistive voltage source (RVS) are shown to limit the stable range of values for wire radius or time step. Using the von Neumann analysis, a stable RVS model for thin wires is developed. The proposed model is verified by comparison with a hard source, an original RVS and NEC-generated reference data. The stabilized RVS introduces no additional stability constraints on those of the wire model while maintaining fast decay of incident fields of the original RVS model.
ISSN:0018-926X
1558-2221
DOI:10.1109/TAP.2003.813613