Reliable Operation of GaInAsP/InP Distributed Feedback Laser with Wirelike Active Regions

Reliable Operation of GaInAsP/InP Distributed Feedback Laser with Wirelike Active Regions

A continuous-wave life test of 1550 nm wavelength buried-heterostructure distributed feedback lasers with wirelike active regions, fabricated by CH4/H2 reactive-ion-etching and OMVPE, was performed at RT. No degradations in lasing characteristics were observed after an aging time of 8200 h at a bias...

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Veröffentlicht in:Japanese Journal of Applied Physics 2003, Vol.42 (Part 1, No. 2A), p.475-476
Hauptverfasser: Ohira, Kazuya, Nunoya, Nobuhiro, Yagi, Hideki, Muranushi, Kengo, Onomura, Akihiro, Tamura, Shigeo, Arai, Shigehisa
Format: Artikel
Sprache:eng
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Zusammenfassung:A continuous-wave life test of 1550 nm wavelength buried-heterostructure distributed feedback lasers with wirelike active regions, fabricated by CH4/H2 reactive-ion-etching and OMVPE, was performed at RT. No degradations in lasing characteristics were observed after an aging time of 8200 h at a bias current of around 10 times the threshold value. 6 refs.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.42.475