Photoluminescence of CdTe crystals grown by physical-vapor transport
High-quality CdTe crystals with resistivities higher than 108 OMEGA cm were grown by the physical-vapor transport (PVT) technique. In, Al, and the transition-metal Sc were introduced at the nominal level of about 6 ppm to the source material. Low-temperature photoluminescence (PL) has been employed...
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Veröffentlicht in: | Journal of electronic materials 2003-07, Vol.32 (7), p.747-751 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | High-quality CdTe crystals with resistivities higher than 108 OMEGA cm were grown by the physical-vapor transport (PVT) technique. In, Al, and the transition-metal Sc were introduced at the nominal level of about 6 ppm to the source material. Low-temperature photoluminescence (PL) has been employed to identify the origins of PL emissions of the crystals. The emission peaks at 1.584 and 1.581 eV were found only in the In-doped crystal. The result suggests that the luminescence line at 1.584 eV is associated with Cd-vacancy/In complex. The intensity of the broadband centered at 1.43 eV decreases with introduction of Sc. 26 refs. |
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ISSN: | 0361-5235 1543-186X |
DOI: | 10.1007/s11664-003-0064-8 |