Absorption and Emission in Quaterthienyl Thin Films

Absorption and Emission in Quaterthienyl Thin Films

The salient features in the absorption and emission spectra of αT4 aggregates (see Figure) and films are fully accounted for using a model based on linear exciton–phonon coupling and structural defects. In particular, the Davydov splitting is calculated to be of the order of 1 eV, and the unusually...

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Veröffentlicht in:Advanced materials (Weinheim) 2003-05, Vol.15 (10), p.818-822
Hauptverfasser: Sun, H., Zhao, Z., Spano, F.C., Beljonne, D., Cornil, J., Shuai, Z., Brédas, J.‐L.
Format: Artikel
Sprache:eng
Schlagworte:
Oligothiophenes
Photo‐active materials
Spectroscopy, features
Structure‐property relationships
Thin films
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Zusammenfassung:The salient features in the absorption and emission spectra of αT4 aggregates (see Figure) and films are fully accounted for using a model based on linear exciton–phonon coupling and structural defects. In particular, the Davydov splitting is calculated to be of the order of 1 eV, and the unusually small 0–0 emission intensity is attributed to the high sensitivity of the 0–0 intensity to basal plane structural defects.
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.200304770