Shear Bulk Wave Transducer Made of (11\bar20)-Plane Epitaxial ZnO Film on R-Sapphire
A (11-20)-plane epitaxial ZnO film is deposited on an R-plane ((01-12)-plane) sapphire substrate. In order to generate a shear bulk wave using the ZnO film, metal electrodes are required at both planes of the ZnO film; namely, the top plane on the top surface of the ZnO film and the bottom plane at...
Gespeichert in:
Veröffentlicht in: | Japanese Journal of Applied Physics 2002, Vol.41 (Part 1, No. 5B), p.3281-3284 |
---|---|
Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A (11-20)-plane epitaxial ZnO film is deposited on an R-plane ((01-12)-plane) sapphire substrate. In order to generate a shear bulk wave using the ZnO film, metal electrodes are required at both planes of the ZnO film; namely, the top plane on the top surface of the ZnO film and the bottom plane at the boundary between the ZnO film and the R-sapphire substrate. A c-plane ((0001)-plane) polycrystal ZnO film is conventionally deposited on the metal film on the R-sapphire substrate. Thus, the (11-20)-plane epitaxial ZnO film for the shear bulk transducer has not been realized until now. The authors realized a (11-20)-plane epitaxial ZnO film with low electrical resistivity (r of the order of 10-4 OHM cm) on an R-sapphire substrate by doping with an impurity such as Al, Ga, or V as a substitute for the metal electrode, and a (11-20)-plane piezoelectric epitaxial ZnO film with high electrical resistivity (r > 10+10 W cm) on this epitaxial ZnO film with low electrical resistivity for fabricating a shear wave transducer. An Al electrode was deposited on the piezoelectric ZnO film. By using the Al electrode as the top-plane electrode and a (11-20)-plane epitaxial ZnO film with low electrical resistivity as the bottom-plane electrode substituting for the metal film, strong shear bulk waves have been generated. 11 refs. |
---|---|
ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/JJAP.41.3281 |