ORIENTATIONAL DEPENDENCE OF ELECTRO-OPTIC PROPERTIES OF SrBi2Ta2O9 FERROELECTRIC THIN FILMS

A-/b- and c-axis oriented SrBi2Ta2O9 thin films were grown on the MgO(110) and MgO(100) substrates, resp., by rf magnetron sputtering deposition method. Optical anisotropy was shown in the ir reflectance spectra for the SrBi2Ta2O9 thin films. Quadratic electrooptic effects were observed only in the...

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Veröffentlicht in:	Jpn.J.Appl.Phys ,Part 1. Vol. 39, no. 10, pp. 5916-5917. 2000 Part 1. Vol. 39, no. 10, pp. 5916-5917. 2000, 2000, Vol.39 (10), p.5916-5917
Hauptverfasser:	Moon, S E, Back, S B, Kwun, S-I, Lee, Y S, Noh, T W, Song, T K
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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Zusammenfassung:	A-/b- and c-axis oriented SrBi2Ta2O9 thin films were grown on the MgO(110) and MgO(100) substrates, resp., by rf magnetron sputtering deposition method. Optical anisotropy was shown in the ir reflectance spectra for the SrBi2Ta2O9 thin films. Quadratic electrooptic effects were observed only in the a-/b-axis oriented films. The effective quadratic electrooptic coefficient was about 3.8 x 10-17 m2/V2. 10 refs.
ISSN:	0021-4922
DOI:	10.1143/jjap.39.5916