Simultaneous reconstruction of electrode contact impedances and internal electrical properties: I. Theory

In electrical impedance tomography (EIT) currents are applied through the electrodes attached on the surface of the object and the resulting voltages are measured using the same or additional electrodes. The internal admittivity distribution is estimated based on the current and voltage data. When t...

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Veröffentlicht in:Measurement science & technology 2002-12, Vol.13 (12), p.1848-1854
Hauptverfasser: Vilhunen, T, Kaipio, J P, Vauhkonen, P J, Savolainen, T, Vauhkonen, M
Format: Artikel
Sprache:eng
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Zusammenfassung:In electrical impedance tomography (EIT) currents are applied through the electrodes attached on the surface of the object and the resulting voltages are measured using the same or additional electrodes. The internal admittivity distribution is estimated based on the current and voltage data. When the voltages are measured on the current carrying electrodes, the contact impedance that exists in the electrode-surface interface causes a voltage drop. In some cases this effect of the electrodes is known. However, this is not always the case and the contact impedance has to be taken into account in the image reconstruction. In this paper we propose an approach for estimating the contact impedance of the electrodes simultaneously with the estimation of the admittivity of the object. The complete electrode model (CEM) is used in the estimation procedure. We compare the proposed approach to a simple method which is based on the well known definition of the sample resistivity. The proposed approach is tested with real measurements by estimating the admittivity of isotonic saline solution in a cylindrical test cell and with simulations in a 3D cylindrical domain. The CEM-based approach is shown to produce results that are similar to the results obtained with the simple approach in the test cell case. The advantage of the CEM-based approach over the simple approach is that the complete electrode model does not have any geometrical constraints, which makes it possible to utilize it in EIT studies. The results show that the CEM-based approach works well and can be used in practical contact impedance estimation with real measurements. (Author)
ISSN:0957-0233
1361-6501
DOI:10.1088/0957-0233/13/12/307