$Phase quantification of beta -Si sub 3 N sub 4 / beta -SiC mixtures by x-ray powder diffraction analysis$

Phase quantification of beta -Si sub 3 N sub 4 / beta -SiC mixtures by x-ray powder diffraction analysis

X-ray pwoder diffraction methods of phase quantification were adapted and compared to mixtures of beta -S sub 3 N sub 4 and beta -SiC. Multiline mean-normalized-intensity methods and whole pattern analysis (Rietveld) both have advantages and disadvantages over each other. Satisfactory results ( <...

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Veröffentlicht in:	Journal of materials science 2000-03, Vol.35 (6), p.1427-1432
Hauptverfasser:	Nicolich, J P, Lences, Z, Dressler, W, Riedel, R
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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