Phase quantification of beta -Si sub 3 N sub 4 / beta -SiC mixtures by x-ray powder diffraction analysis

X-ray pwoder diffraction methods of phase quantification were adapted and compared to mixtures of beta -S sub 3 N sub 4 and beta -SiC. Multiline mean-normalized-intensity methods and whole pattern analysis (Rietveld) both have advantages and disadvantages over each other. Satisfactory results ( < 3% absolute deviation) can be achieved in minimal time using intensity normalization methods. Phase quantification using the Rietveld method requires significantly longer measuring time, evaluation time and expertise to obtain the same results.