Application of an optical birefringence interferometer to photothermal detection
In this paper a birefringence interferometer is used for detecting both change in reflectivity and surface deformation caused by photothermal effect or thermal waves excited by anyother pump source. The instrument is very simple, with high immunity against noise and sensitivity. © 2002 Wiley Periodi...
Gespeichert in:
| Veröffentlicht in: | Microwave and optical technology letters 2002-10, Vol.35 (2), p.140-143 |
|---|---|
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 143 |
|---|---|
| container_issue | 2 |
| container_start_page | 140 |
| container_title | Microwave and optical technology letters |
| container_volume | 35 |
| creator | Xu, X. D. Kuo, P. K. Zhang, S. Y. Shui, X. J. Zhang, Z. N. |
| description | In this paper a birefringence interferometer is used for detecting both change in reflectivity and surface deformation caused by photothermal effect or thermal waves excited by anyother pump source. The instrument is very simple, with high immunity against noise and sensitivity. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 35: 140–143, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10540 |
| doi_str_mv | 10.1002/mop.10540 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_27652716</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>27652716</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4020-c5b140cefb7cc23ab741d4a5f66897978dddf53c6146d9fa7611954fcbaacb3</originalsourceid><addsrcrecordid>eNp1kMFOwzAQRC0EEqVw4A9yQuIQaieOnRxLBQWptBUg6M1yHJsakjjYrqB_j0uAG5fd0erNSDsAnCJ4gSBMRo3pgsgw3AMDBIs8TiiB-2AA8yKLE0zpIThy7hVCmFKaDMBy3HW1Ftxr00ZGRTzMzodDHZXaSmV1-yJbISPdemmVtKaRQUTeRN3aeOPX0jYBrsJV7EKOwYHitZMnP3sIHq6vHic38WwxvZ2MZ7HAMIGxyEqEoZCqpEIkKS8pRhXmmSIkL2hB86qqVJYKgjCpCsUpQajIsBIl56JMh-CsT-2sed9I51mjnZB1zVtpNo6Fr7OEIhLA8x4U1jgXHmKd1Q23W4Yg2zXGQmPsu7HAjnr2Q9dy-z_I7hbLX0fcO7Tz8vPPwe0bIzSlGXueTxmcT55Wq8t7lqZfA3J-kA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>27652716</pqid></control><display><type>article</type><title>Application of an optical birefringence interferometer to photothermal detection</title><source>Wiley Online Library Journals Frontfile Complete</source><creator>Xu, X. D. ; Kuo, P. K. ; Zhang, S. Y. ; Shui, X. J. ; Zhang, Z. N.</creator><creatorcontrib>Xu, X. D. ; Kuo, P. K. ; Zhang, S. Y. ; Shui, X. J. ; Zhang, Z. N.</creatorcontrib><description>In this paper a birefringence interferometer is used for detecting both change in reflectivity and surface deformation caused by photothermal effect or thermal waves excited by anyother pump source. The instrument is very simple, with high immunity against noise and sensitivity. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 35: 140–143, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10540</description><identifier>ISSN: 0895-2477</identifier><identifier>EISSN: 1098-2760</identifier><identifier>DOI: 10.1002/mop.10540</identifier><language>eng</language><publisher>New York: Wiley Subscription Services, Inc., A Wiley Company</publisher><subject>birefringence ; interferometer ; photothermal detection</subject><ispartof>Microwave and optical technology letters, 2002-10, Vol.35 (2), p.140-143</ispartof><rights>Copyright © 2002 Wiley Periodicals, Inc.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4020-c5b140cefb7cc23ab741d4a5f66897978dddf53c6146d9fa7611954fcbaacb3</citedby><cites>FETCH-LOGICAL-c4020-c5b140cefb7cc23ab741d4a5f66897978dddf53c6146d9fa7611954fcbaacb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fmop.10540$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fmop.10540$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,27901,27902,45550,45551</link.rule.ids></links><search><creatorcontrib>Xu, X. D.</creatorcontrib><creatorcontrib>Kuo, P. K.</creatorcontrib><creatorcontrib>Zhang, S. Y.</creatorcontrib><creatorcontrib>Shui, X. J.</creatorcontrib><creatorcontrib>Zhang, Z. N.</creatorcontrib><title>Application of an optical birefringence interferometer to photothermal detection</title><title>Microwave and optical technology letters</title><addtitle>Microw. Opt. Technol. Lett</addtitle><description>In this paper a birefringence interferometer is used for detecting both change in reflectivity and surface deformation caused by photothermal effect or thermal waves excited by anyother pump source. The instrument is very simple, with high immunity against noise and sensitivity. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 35: 140–143, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10540</description><subject>birefringence</subject><subject>interferometer</subject><subject>photothermal detection</subject><issn>0895-2477</issn><issn>1098-2760</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><recordid>eNp1kMFOwzAQRC0EEqVw4A9yQuIQaieOnRxLBQWptBUg6M1yHJsakjjYrqB_j0uAG5fd0erNSDsAnCJ4gSBMRo3pgsgw3AMDBIs8TiiB-2AA8yKLE0zpIThy7hVCmFKaDMBy3HW1Ftxr00ZGRTzMzodDHZXaSmV1-yJbISPdemmVtKaRQUTeRN3aeOPX0jYBrsJV7EKOwYHitZMnP3sIHq6vHic38WwxvZ2MZ7HAMIGxyEqEoZCqpEIkKS8pRhXmmSIkL2hB86qqVJYKgjCpCsUpQajIsBIl56JMh-CsT-2sed9I51mjnZB1zVtpNo6Fr7OEIhLA8x4U1jgXHmKd1Q23W4Yg2zXGQmPsu7HAjnr2Q9dy-z_I7hbLX0fcO7Tz8vPPwe0bIzSlGXueTxmcT55Wq8t7lqZfA3J-kA</recordid><startdate>20021020</startdate><enddate>20021020</enddate><creator>Xu, X. D.</creator><creator>Kuo, P. K.</creator><creator>Zhang, S. Y.</creator><creator>Shui, X. J.</creator><creator>Zhang, Z. N.</creator><general>Wiley Subscription Services, Inc., A Wiley Company</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20021020</creationdate><title>Application of an optical birefringence interferometer to photothermal detection</title><author>Xu, X. D. ; Kuo, P. K. ; Zhang, S. Y. ; Shui, X. J. ; Zhang, Z. N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4020-c5b140cefb7cc23ab741d4a5f66897978dddf53c6146d9fa7611954fcbaacb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><topic>birefringence</topic><topic>interferometer</topic><topic>photothermal detection</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Xu, X. D.</creatorcontrib><creatorcontrib>Kuo, P. K.</creatorcontrib><creatorcontrib>Zhang, S. Y.</creatorcontrib><creatorcontrib>Shui, X. J.</creatorcontrib><creatorcontrib>Zhang, Z. N.</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microwave and optical technology letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Xu, X. D.</au><au>Kuo, P. K.</au><au>Zhang, S. Y.</au><au>Shui, X. J.</au><au>Zhang, Z. N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Application of an optical birefringence interferometer to photothermal detection</atitle><jtitle>Microwave and optical technology letters</jtitle><addtitle>Microw. Opt. Technol. Lett</addtitle><date>2002-10-20</date><risdate>2002</risdate><volume>35</volume><issue>2</issue><spage>140</spage><epage>143</epage><pages>140-143</pages><issn>0895-2477</issn><eissn>1098-2760</eissn><abstract>In this paper a birefringence interferometer is used for detecting both change in reflectivity and surface deformation caused by photothermal effect or thermal waves excited by anyother pump source. The instrument is very simple, with high immunity against noise and sensitivity. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 35: 140–143, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10540</abstract><cop>New York</cop><pub>Wiley Subscription Services, Inc., A Wiley Company</pub><doi>10.1002/mop.10540</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0895-2477 |
| ispartof | Microwave and optical technology letters, 2002-10, Vol.35 (2), p.140-143 |
| issn | 0895-2477 1098-2760 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_27652716 |
| source | Wiley Online Library Journals Frontfile Complete |
| subjects | birefringence interferometer photothermal detection |
| title | Application of an optical birefringence interferometer to photothermal detection |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T11%3A49%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Application%20of%20an%20optical%20birefringence%20interferometer%20to%20photothermal%20detection&rft.jtitle=Microwave%20and%20optical%20technology%20letters&rft.au=Xu,%20X.%20D.&rft.date=2002-10-20&rft.volume=35&rft.issue=2&rft.spage=140&rft.epage=143&rft.pages=140-143&rft.issn=0895-2477&rft.eissn=1098-2760&rft_id=info:doi/10.1002/mop.10540&rft_dat=%3Cproquest_cross%3E27652716%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=27652716&rft_id=info:pmid/&rfr_iscdi=true |