Application of an optical birefringence interferometer to photothermal detection

In this paper a birefringence interferometer is used for detecting both change in reflectivity and surface deformation caused by photothermal effect or thermal waves excited by anyother pump source. The instrument is very simple, with high immunity against noise and sensitivity. © 2002 Wiley Periodi...

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Veröffentlicht in:Microwave and optical technology letters 2002-10, Vol.35 (2), p.140-143
Hauptverfasser: Xu, X. D., Kuo, P. K., Zhang, S. Y., Shui, X. J., Zhang, Z. N.
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Sprache:eng
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Zusammenfassung:In this paper a birefringence interferometer is used for detecting both change in reflectivity and surface deformation caused by photothermal effect or thermal waves excited by anyother pump source. The instrument is very simple, with high immunity against noise and sensitivity. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 35: 140–143, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10540
ISSN:0895-2477
1098-2760
DOI:10.1002/mop.10540