PHASE TRANSITIONS IN PbZr1-xTixO3 CERAMICS PREPARED BY DIFFERENT TECHNIQUES

Authors present study of the phase transitions and the temperature dependence of the optical properties of the PbZr0.235Ti0.765O3 films prepared by multi-target reactive sputtering and sol-gel methods. Optical measurements were performed with an ellipsometer operating in rotating analyzer mode. The...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Japanese Journal of Applied Physics, Part 1 Part 1, 2002-11, Vol.41 (11B), p.6966-6968
Hauptverfasser: Deyneka, A, Suchaneck, G, Jastrabik, L, Gerlach, G
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Authors present study of the phase transitions and the temperature dependence of the optical properties of the PbZr0.235Ti0.765O3 films prepared by multi-target reactive sputtering and sol-gel methods. Optical measurements were performed with an ellipsometer operating in rotating analyzer mode. The main ellipsometric angles Y and D were measured in the spectral range from 300 to 1200 nm. High-temperature measurements were performed in a specially designed thermostat system. The samples were heated to 500 C to reach the paraelectric phase. The temperature dependences of the refractive index and the absorption coefficient at fixed wavelengths, and the optical gap obtained from isoabsorption curves at a=1000 cm-1 were obtained from ellipsometric experiment. 17 refs.
ISSN:0021-4922
DOI:10.1143/JJAP.41.6966