Annealing Enhancement Effect by Light Illumination on Proton Irradiated Cu(In,Ga)Se2 Thin-Film Solar Cells
Authors investigated the high radiation tolerance of copper indium gallium diselenide (CIGS) thin-film solar cells by conducting in situ measurements of short circuit current and open circuit voltage of CIGS thin-film solar cells during and after proton irradiation under short circuit condition. The...
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Veröffentlicht in: | Japanese Journal of Applied Physics 2002-01, Vol.41 (Part 2, No. 7A), p.L797-L799 |
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Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Authors investigated the high radiation tolerance of copper indium gallium diselenide (CIGS) thin-film solar cells by conducting in situ measurements of short circuit current and open circuit voltage of CIGS thin-film solar cells during and after proton irradiation under short circuit condition. The annealing rate of proton-induced defects in CIGS thin-film solar cells under light illumination with an AM0 solar simulator is higher than that under dark conditions. The activation energy of proton-induced defects in the CIGS thin-film solar cells with (without) light illumination is 0.80 eV (0.92 eV), which implies an enhanced defect annealing rate in CIGS thin-film solar cells due to minority-carrier injection. 15 refs. |
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ISSN: | 0021-4922 |
DOI: | 10.1143/JJAP.41.L797 |