PHYSICAL PROPERTIES OF SiO2-DOPED Si FILMS AND ELECTROLUMINESCENCE IN METAL/SiO2-DOPED Si/P-Si DIODES

The doping of SiO2 islands in thin Si films was carried out using rf magnetron sputtering. These films are referred to SiO2-doped Si films. These films display efficient optical absorption in the optical energy region of 1.4-2.0 eV and the absorption is comparable to that of a-Si:H films. Efficient...

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Veröffentlicht in:Japanese Journal of Applied Physics, Part 1 Part 1, 2002-01, Vol.41 (12), p.7481-7486
Hauptverfasser: Osaka, Y, Kohno, K, Mizuno, H, Koshida, N
Format: Artikel
Sprache:eng
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Zusammenfassung:The doping of SiO2 islands in thin Si films was carried out using rf magnetron sputtering. These films are referred to SiO2-doped Si films. These films display efficient optical absorption in the optical energy region of 1.4-2.0 eV and the absorption is comparable to that of a-Si:H films. Efficient photoluminesecence from Si network in these films was observed. Also, efficient electroluminescence from metal/SiO2-doped Si/p-Si diodes was observed. It is concluded that this luminescence originates from the optical transition between electron- bound states in films and injected holes from p-Si. These optical characteristics suggest that the SiO2-doped Si films are useful for photovoltatic applications. 13 refs.
ISSN:0021-4922
DOI:10.1143/JJAP.41.7481