METALORGANIC VAPOUR PHASE EPITAXY GROWTH OF InP-BASED HETEROJUNCTION BIPOLAR TRANSISTORS WITH CARBON DOPED InGaAs BASE USING TERTIARYBUTYLARSINE AND TERTIARYBUTYLPHOSPHINE IN N2 AMBIENT

A process for growth of heterostructure bipolar transistors (HBT) using tertiarybutylarsine (TBA) and tertiarybutylphosphine (TBP) in N2 ambient is realized, which is compatible with a high temperature overgrowth, thus suitable for the vertical integration of a laser structure on top of an HBT. A hi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Jpn.J.Appl.Phys ,Part 1. Vol. 39, no. 11, pp. 6162-6165. 2000 Part 1. Vol. 39, no. 11, pp. 6162-6165. 2000, 2000-01, Vol.39 (11), p.6162-6165
Hauptverfasser: Keiper, D, Velling, P, Prost, W, Agethen, M, Tegude, F-J, Landgren, G
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A process for growth of heterostructure bipolar transistors (HBT) using tertiarybutylarsine (TBA) and tertiarybutylphosphine (TBP) in N2 ambient is realized, which is compatible with a high temperature overgrowth, thus suitable for the vertical integration of a laser structure on top of an HBT. A high growth temperature for the C-InGaAs base is favorable, to ensure no degradation during subsequent growth. Increasing the growth temperature after the base from 500 to 680 C within the emitter layer instead of at the base-emitter interface improved the ideality factors, the dc gain and the turn-on voltage. 32 refs.
ISSN:0021-4922
DOI:10.1143/jjap.39.6162