Influence of Mo interlayers on the microstructure of layers and reflective characteristics of Ru/Be multilayer mirrors

The influence of Mo interlayers on the microstructure of films and boundaries, and the reflective characteristics of Ru/Be multilayer mirrors (MLM) were studied by X-ray reflectometry and diffractometry, and secondary ion mass spectrometry (SIMS). An increase in the reflection coefficients of MLM at...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Optics express 2022-12, Vol.30 (26), p.46749-46761
Hauptverfasser: Smertin, R M, Chkhalo, N I, Drozdov, M N, Garakhin, S A, Zuev, S Yu, Polkovnikov, V N, Salashchenko, N N, Yunin, P A
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The influence of Mo interlayers on the microstructure of films and boundaries, and the reflective characteristics of Ru/Be multilayer mirrors (MLM) were studied by X-ray reflectometry and diffractometry, and secondary ion mass spectrometry (SIMS). An increase in the reflection coefficients of MLM at a wavelength of 11.4 nm to record values of R = 72.2% and FWHM to Δλ = 0.38 nm is shown. The effect of interlayers on the structural and reflective characteristics of MLM is explained by the barrier properties of the Mo layers, which prevent the mutual mixing of the Ru and Be layers, which leads to the formation of beryllides and a decrease in the X-ray optical contrast at the boundaries.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.475079