High-resolution distance meter using optical intensity modulation at 28 GHz

A high resolution distance meter has been fabricated using optical waveguide modulators. The meter was evaluated in the National Research Laboratory of Metrology (Japan) semi-underground tunnel. The measurement resolution is 1 and 3 \#m\m for a distance of 5 and 100 m, respectively, in one standard...

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Veröffentlicht in:Measurement science & technology 1998-07, Vol.9 (7), p.1049-1052
Hauptverfasser: Fujima, Ichiro, Iwasaki, Shigeo, Seta, Katuo
Format: Artikel
Sprache:eng
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Zusammenfassung:A high resolution distance meter has been fabricated using optical waveguide modulators. The meter was evaluated in the National Research Laboratory of Metrology (Japan) semi-underground tunnel. The measurement resolution is 1 and 3 \#m\m for a distance of 5 and 100 m, respectively, in one standard deviation after correction of the cyclic error. Cyclic errors are examined for 28 GHz optical intensity modulation. (Original abstract - amended)
ISSN:0957-0233
1361-6501
DOI:10.1088/0957-0233/9/7/007