Linearity characteristics of GaAs HBTs and the influence of collector design
The linearity characteristics of GaAs heterojunction bipolar transistors (HBTs) are studied through measurement and analysis. Third-order intermodulation distortion behavior of HBTs is examined on devices with various epilayer designs and at various bias points, loads, and frequencies. Calculations...
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Veröffentlicht in: | IEEE transactions on microwave theory and techniques 2000-12, Vol.48 (12), p.2377-2388 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The linearity characteristics of GaAs heterojunction bipolar transistors (HBTs) are studied through measurement and analysis. Third-order intermodulation distortion behavior of HBTs is examined on devices with various epilayer designs and at various bias points, loads, and frequencies. Calculations from an analytical model reveal a strong bias and load dependence of third-order intercept point (IP3) on the nonlinearities from transconductance and the voltage dependence of base-collector capacitance. However, a simple model is not able to predict the fine details of IP3 with bias. A large-signal HBT model with an accurate description of the base-collector charge is shown to account for the measured trends. The base-collector charge function accounts for the modulation of base-collector capacitance with current, electron velocity modulation, and the Kirk effect (base pushout) for GaAs-based HBTs. A detailed study of the influence of collector design on linearity is also presented. |
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ISSN: | 0018-9480 1557-9670 |
DOI: | 10.1109/22.898987 |