High-sensitivity photodetectors with on-chip pinhole for laser scanning microscopy

We manufactured new high-sensitivity solid-state detectors, specifically designed for measurements in laser scanning microscopy (LSM). These single-photon avalanche diodes (SPAD's) improve the performance achievable with an LSM apparatus in the optical inspection of microelectronic devices and...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on electron devices 2000-07, Vol.47 (7), p.1472-1476
Hauptverfasser: Zappa, F., Ghioni, M., Zappa, R., Drodofsky, U.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1476
container_issue 7
container_start_page 1472
container_title IEEE transactions on electron devices
container_volume 47
creator Zappa, F.
Ghioni, M.
Zappa, R.
Drodofsky, U.
description We manufactured new high-sensitivity solid-state detectors, specifically designed for measurements in laser scanning microscopy (LSM). These single-photon avalanche diodes (SPAD's) improve the performance achievable with an LSM apparatus in the optical inspection of microelectronic devices and circuits. Innovative detector structures that incorporate an on-chip pinhole filter are presented. Experimental measurements show that SPAD's perform better than standard photomultiplier tubes.
doi_str_mv 10.1109/16.848295
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_27558128</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>848295</ieee_id><sourcerecordid>2435130471</sourcerecordid><originalsourceid>FETCH-LOGICAL-c335t-522c711453d177be8720870b67bfe6788823136f8cff7ecd39ad73431cf6df743</originalsourceid><addsrcrecordid>eNqF0b9LAzEUB_AgCtbq4OoUHASHq_md3CiiVigIonO45pJeyvVyJqnS_94rVxxcnB6P9-HBly8AlxjNMEblHRYzxRQp-RGYYM5lUQomjsEEIayKkip6Cs5SWg-rYIxMwNvcr5oi2S757L983sG-CTnUNluTQ0zw2-cGhq4wje9h77smtBa6EGFbJRthMlXX-W4FN97EkEzod-fgxFVtsheHOQUfT4_vD_Ni8fr88nC_KAylPBecECMxZpzWWMqlVZIgJdFSyKWzQiqlCMVUOGWck9bUtKxqSRnFxonaSUan4Gb828fwubUp641PxrZt1dmwTZooSkqkxP9Qcq7wwKfg-g9ch23shhBaKU4oY6Uc0O2I9nlTtE730W-quNMY6X0HGgs9djDYq9F6a-2vOxx_ACvngSY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>885234497</pqid></control><display><type>article</type><title>High-sensitivity photodetectors with on-chip pinhole for laser scanning microscopy</title><source>IEEE Electronic Library (IEL)</source><creator>Zappa, F. ; Ghioni, M. ; Zappa, R. ; Drodofsky, U.</creator><creatorcontrib>Zappa, F. ; Ghioni, M. ; Zappa, R. ; Drodofsky, U.</creatorcontrib><description>We manufactured new high-sensitivity solid-state detectors, specifically designed for measurements in laser scanning microscopy (LSM). These single-photon avalanche diodes (SPAD's) improve the performance achievable with an LSM apparatus in the optical inspection of microelectronic devices and circuits. Innovative detector structures that incorporate an on-chip pinhole filter are presented. Experimental measurements show that SPAD's perform better than standard photomultiplier tubes.</description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/16.848295</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Photodetectors</subject><ispartof>IEEE transactions on electron devices, 2000-07, Vol.47 (7), p.1472-1476</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2000</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c335t-522c711453d177be8720870b67bfe6788823136f8cff7ecd39ad73431cf6df743</citedby><cites>FETCH-LOGICAL-c335t-522c711453d177be8720870b67bfe6788823136f8cff7ecd39ad73431cf6df743</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/848295$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/848295$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Zappa, F.</creatorcontrib><creatorcontrib>Ghioni, M.</creatorcontrib><creatorcontrib>Zappa, R.</creatorcontrib><creatorcontrib>Drodofsky, U.</creatorcontrib><title>High-sensitivity photodetectors with on-chip pinhole for laser scanning microscopy</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>We manufactured new high-sensitivity solid-state detectors, specifically designed for measurements in laser scanning microscopy (LSM). These single-photon avalanche diodes (SPAD's) improve the performance achievable with an LSM apparatus in the optical inspection of microelectronic devices and circuits. Innovative detector structures that incorporate an on-chip pinhole filter are presented. Experimental measurements show that SPAD's perform better than standard photomultiplier tubes.</description><subject>Photodetectors</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqF0b9LAzEUB_AgCtbq4OoUHASHq_md3CiiVigIonO45pJeyvVyJqnS_94rVxxcnB6P9-HBly8AlxjNMEblHRYzxRQp-RGYYM5lUQomjsEEIayKkip6Cs5SWg-rYIxMwNvcr5oi2S757L983sG-CTnUNluTQ0zw2-cGhq4wje9h77smtBa6EGFbJRthMlXX-W4FN97EkEzod-fgxFVtsheHOQUfT4_vD_Ni8fr88nC_KAylPBecECMxZpzWWMqlVZIgJdFSyKWzQiqlCMVUOGWck9bUtKxqSRnFxonaSUan4Gb828fwubUp641PxrZt1dmwTZooSkqkxP9Qcq7wwKfg-g9ch23shhBaKU4oY6Uc0O2I9nlTtE730W-quNMY6X0HGgs9djDYq9F6a-2vOxx_ACvngSY</recordid><startdate>200007</startdate><enddate>200007</enddate><creator>Zappa, F.</creator><creator>Ghioni, M.</creator><creator>Zappa, R.</creator><creator>Drodofsky, U.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>7U5</scope></search><sort><creationdate>200007</creationdate><title>High-sensitivity photodetectors with on-chip pinhole for laser scanning microscopy</title><author>Zappa, F. ; Ghioni, M. ; Zappa, R. ; Drodofsky, U.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c335t-522c711453d177be8720870b67bfe6788823136f8cff7ecd39ad73431cf6df743</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Photodetectors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zappa, F.</creatorcontrib><creatorcontrib>Ghioni, M.</creatorcontrib><creatorcontrib>Zappa, R.</creatorcontrib><creatorcontrib>Drodofsky, U.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Solid State and Superconductivity Abstracts</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Zappa, F.</au><au>Ghioni, M.</au><au>Zappa, R.</au><au>Drodofsky, U.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High-sensitivity photodetectors with on-chip pinhole for laser scanning microscopy</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>2000-07</date><risdate>2000</risdate><volume>47</volume><issue>7</issue><spage>1472</spage><epage>1476</epage><pages>1472-1476</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>We manufactured new high-sensitivity solid-state detectors, specifically designed for measurements in laser scanning microscopy (LSM). These single-photon avalanche diodes (SPAD's) improve the performance achievable with an LSM apparatus in the optical inspection of microelectronic devices and circuits. Innovative detector structures that incorporate an on-chip pinhole filter are presented. Experimental measurements show that SPAD's perform better than standard photomultiplier tubes.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/16.848295</doi><tpages>5</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9383
ispartof IEEE transactions on electron devices, 2000-07, Vol.47 (7), p.1472-1476
issn 0018-9383
1557-9646
language eng
recordid cdi_proquest_miscellaneous_27558128
source IEEE Electronic Library (IEL)
subjects Photodetectors
title High-sensitivity photodetectors with on-chip pinhole for laser scanning microscopy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T14%3A11%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=High-sensitivity%20photodetectors%20with%20on-chip%20pinhole%20for%20laser%20scanning%20microscopy&rft.jtitle=IEEE%20transactions%20on%20electron%20devices&rft.au=Zappa,%20F.&rft.date=2000-07&rft.volume=47&rft.issue=7&rft.spage=1472&rft.epage=1476&rft.pages=1472-1476&rft.issn=0018-9383&rft.eissn=1557-9646&rft.coden=IETDAI&rft_id=info:doi/10.1109/16.848295&rft_dat=%3Cproquest_RIE%3E2435130471%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=885234497&rft_id=info:pmid/&rft_ieee_id=848295&rfr_iscdi=true