High-sensitivity photodetectors with on-chip pinhole for laser scanning microscopy
We manufactured new high-sensitivity solid-state detectors, specifically designed for measurements in laser scanning microscopy (LSM). These single-photon avalanche diodes (SPAD's) improve the performance achievable with an LSM apparatus in the optical inspection of microelectronic devices and...
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Veröffentlicht in: | IEEE transactions on electron devices 2000-07, Vol.47 (7), p.1472-1476 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We manufactured new high-sensitivity solid-state detectors, specifically designed for measurements in laser scanning microscopy (LSM). These single-photon avalanche diodes (SPAD's) improve the performance achievable with an LSM apparatus in the optical inspection of microelectronic devices and circuits. Innovative detector structures that incorporate an on-chip pinhole filter are presented. Experimental measurements show that SPAD's perform better than standard photomultiplier tubes. |
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ISSN: | 0018-9383 1557-9646 |
DOI: | 10.1109/16.848295 |