Modelling and simulation for dielectric constant of aerogel

Aerogel exhibits several attractive features as an interconnect dielectric in ULSI, because of its ultralow dielectric constant ( ϵ eff=1∼4.2), high dielectric strength, and good gapfill capabilities. In this paper, a uniformly distributed pore structure model which shows a significant improvement c...

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Veröffentlicht in:Microelectronic engineering 2000-12, Vol.54 (3), p.295-301
Hauptverfasser: Xiao, Xia, Streiter, Reinhard, Ruan, Gang, Song, Renru, Otto, Thomas, Gessner, Thomas
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container_end_page 301
container_issue 3
container_start_page 295
container_title Microelectronic engineering
container_volume 54
creator Xiao, Xia
Streiter, Reinhard
Ruan, Gang
Song, Renru
Otto, Thomas
Gessner, Thomas
description Aerogel exhibits several attractive features as an interconnect dielectric in ULSI, because of its ultralow dielectric constant ( ϵ eff=1∼4.2), high dielectric strength, and good gapfill capabilities. In this paper, a uniformly distributed pore structure model which shows a significant improvement compared with parallel and serial models is presented to simulate the ϵ eff of aerogel. An empirical relation between the ϵ eff of aerogel and its porosity is obtained. At the same time, the effect of porosity, pore shape, pore size, pore-size distribution and pore distribution on the ϵ eff of aerogel is determined. It is found that the porosity is a major factor which affects ϵ eff.
doi_str_mv 10.1016/S0167-9317(00)00257-4
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subjects Aerogel
Applied sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Dielectric
Dielectric properties of solids and liquids
Dielectrics, piezoelectrics, and ferroelectrics and their properties
Electronics
Exact sciences and technology
Materials
Permittivity (dielectric function)
Physics
Porosity
title Modelling and simulation for dielectric constant of aerogel
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