Modelling and simulation for dielectric constant of aerogel
Aerogel exhibits several attractive features as an interconnect dielectric in ULSI, because of its ultralow dielectric constant ( ϵ eff=1∼4.2), high dielectric strength, and good gapfill capabilities. In this paper, a uniformly distributed pore structure model which shows a significant improvement c...
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Veröffentlicht in: | Microelectronic engineering 2000-12, Vol.54 (3), p.295-301 |
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container_title | Microelectronic engineering |
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creator | Xiao, Xia Streiter, Reinhard Ruan, Gang Song, Renru Otto, Thomas Gessner, Thomas |
description | Aerogel exhibits several attractive features as an interconnect dielectric in ULSI, because of its ultralow dielectric constant (
ϵ
eff=1∼4.2), high dielectric strength, and good gapfill capabilities. In this paper, a uniformly distributed pore structure model which shows a significant improvement compared with parallel and serial models is presented to simulate the
ϵ
eff of aerogel. An empirical relation between the
ϵ
eff of aerogel and its porosity is obtained. At the same time, the effect of porosity, pore shape, pore size, pore-size distribution and pore distribution on the
ϵ
eff of aerogel is determined. It is found that the porosity is a major factor which affects
ϵ
eff. |
doi_str_mv | 10.1016/S0167-9317(00)00257-4 |
format | Article |
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ϵ
eff=1∼4.2), high dielectric strength, and good gapfill capabilities. In this paper, a uniformly distributed pore structure model which shows a significant improvement compared with parallel and serial models is presented to simulate the
ϵ
eff of aerogel. An empirical relation between the
ϵ
eff of aerogel and its porosity is obtained. At the same time, the effect of porosity, pore shape, pore size, pore-size distribution and pore distribution on the
ϵ
eff of aerogel is determined. It is found that the porosity is a major factor which affects
ϵ
eff.</description><identifier>ISSN: 0167-9317</identifier><identifier>EISSN: 1873-5568</identifier><identifier>DOI: 10.1016/S0167-9317(00)00257-4</identifier><identifier>CODEN: MIENEF</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Aerogel ; Applied sciences ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Dielectric ; Dielectric properties of solids and liquids ; Dielectrics, piezoelectrics, and ferroelectrics and their properties ; Electronics ; Exact sciences and technology ; Materials ; Permittivity (dielectric function) ; Physics ; Porosity</subject><ispartof>Microelectronic engineering, 2000-12, Vol.54 (3), p.295-301</ispartof><rights>2000 Elsevier Science B.V.</rights><rights>2001 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c366t-5c6124003f140be4e98413926d633491695ee85a8809973596944c1b4b6e64e43</citedby><cites>FETCH-LOGICAL-c366t-5c6124003f140be4e98413926d633491695ee85a8809973596944c1b4b6e64e43</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/S0167-9317(00)00257-4$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,777,781,3537,27905,27906,45976</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=834242$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Xiao, Xia</creatorcontrib><creatorcontrib>Streiter, Reinhard</creatorcontrib><creatorcontrib>Ruan, Gang</creatorcontrib><creatorcontrib>Song, Renru</creatorcontrib><creatorcontrib>Otto, Thomas</creatorcontrib><creatorcontrib>Gessner, Thomas</creatorcontrib><title>Modelling and simulation for dielectric constant of aerogel</title><title>Microelectronic engineering</title><description>Aerogel exhibits several attractive features as an interconnect dielectric in ULSI, because of its ultralow dielectric constant (
ϵ
eff=1∼4.2), high dielectric strength, and good gapfill capabilities. In this paper, a uniformly distributed pore structure model which shows a significant improvement compared with parallel and serial models is presented to simulate the
ϵ
eff of aerogel. An empirical relation between the
ϵ
eff of aerogel and its porosity is obtained. At the same time, the effect of porosity, pore shape, pore size, pore-size distribution and pore distribution on the
ϵ
eff of aerogel is determined. It is found that the porosity is a major factor which affects
ϵ
eff.</description><subject>Aerogel</subject><subject>Applied sciences</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Dielectric</subject><subject>Dielectric properties of solids and liquids</subject><subject>Dielectrics, piezoelectrics, and ferroelectrics and their properties</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Materials</subject><subject>Permittivity (dielectric function)</subject><subject>Physics</subject><subject>Porosity</subject><issn>0167-9317</issn><issn>1873-5568</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><recordid>eNqFkFtLAzEQhYMoWKs_QVgQRB9WJ5vLJvggUrxBxQf1OaTZ2RLZJjXZCv57txd89WWGgTPnzHyEnFK4okDl9dtQ6lIzWl8AXAJUoi75HhlRVbNSCKn2yehPckiOcv6EYeagRuTmJTbYdT7MCxuaIvvFqrO9j6FoYyoajx26PnlXuBhyb0NfxLawmOIcu2Ny0Nou48muj8nHw_375Kmcvj4-T-6mpWNS9qVwklYcgLWUwww5asUp05VsJGNcU6kFohJWKdC6ZkJLzbmjMz6TKDlyNibnW99lil8rzL1Z-OyGq23AuMqmqoWgoqoGodgKXYo5J2zNMvmFTT-GglmjMhtUZs3BAJgNKrMOONsF2Oxs1yYbnM9_y4rxiq_db7cqHH799phMdh6Dw8anAZJpov8n5xd2M3q-</recordid><startdate>20001201</startdate><enddate>20001201</enddate><creator>Xiao, Xia</creator><creator>Streiter, Reinhard</creator><creator>Ruan, Gang</creator><creator>Song, Renru</creator><creator>Otto, Thomas</creator><creator>Gessner, Thomas</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20001201</creationdate><title>Modelling and simulation for dielectric constant of aerogel</title><author>Xiao, Xia ; Streiter, Reinhard ; Ruan, Gang ; Song, Renru ; Otto, Thomas ; Gessner, Thomas</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c366t-5c6124003f140be4e98413926d633491695ee85a8809973596944c1b4b6e64e43</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Aerogel</topic><topic>Applied sciences</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Dielectric</topic><topic>Dielectric properties of solids and liquids</topic><topic>Dielectrics, piezoelectrics, and ferroelectrics and their properties</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Materials</topic><topic>Permittivity (dielectric function)</topic><topic>Physics</topic><topic>Porosity</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Xiao, Xia</creatorcontrib><creatorcontrib>Streiter, Reinhard</creatorcontrib><creatorcontrib>Ruan, Gang</creatorcontrib><creatorcontrib>Song, Renru</creatorcontrib><creatorcontrib>Otto, Thomas</creatorcontrib><creatorcontrib>Gessner, Thomas</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microelectronic engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Xiao, Xia</au><au>Streiter, Reinhard</au><au>Ruan, Gang</au><au>Song, Renru</au><au>Otto, Thomas</au><au>Gessner, Thomas</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Modelling and simulation for dielectric constant of aerogel</atitle><jtitle>Microelectronic engineering</jtitle><date>2000-12-01</date><risdate>2000</risdate><volume>54</volume><issue>3</issue><spage>295</spage><epage>301</epage><pages>295-301</pages><issn>0167-9317</issn><eissn>1873-5568</eissn><coden>MIENEF</coden><abstract>Aerogel exhibits several attractive features as an interconnect dielectric in ULSI, because of its ultralow dielectric constant (
ϵ
eff=1∼4.2), high dielectric strength, and good gapfill capabilities. In this paper, a uniformly distributed pore structure model which shows a significant improvement compared with parallel and serial models is presented to simulate the
ϵ
eff of aerogel. An empirical relation between the
ϵ
eff of aerogel and its porosity is obtained. At the same time, the effect of porosity, pore shape, pore size, pore-size distribution and pore distribution on the
ϵ
eff of aerogel is determined. It is found that the porosity is a major factor which affects
ϵ
eff.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/S0167-9317(00)00257-4</doi><tpages>7</tpages></addata></record> |
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source | Elsevier ScienceDirect Journals |
subjects | Aerogel Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Dielectric Dielectric properties of solids and liquids Dielectrics, piezoelectrics, and ferroelectrics and their properties Electronics Exact sciences and technology Materials Permittivity (dielectric function) Physics Porosity |
title | Modelling and simulation for dielectric constant of aerogel |
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