High-speed sense circuit techniques for a 1-mbit BiCMOS cache SRAM
This paper describes a high‐speed and low‐power 1‐Mbit BiCMOS cache SRAM sense circuit fabricated using a 0.5‐μm BiCMOS process technology. By using the quasi‐6 module structure, switching between 18‐ and 36‐bit output can be carried out without access delay. Because of the development of a sense ci...
Gespeichert in:
Veröffentlicht in: | Electronics & communications in Japan. Part 2, Electronics Electronics, 1998-08, Vol.81 (8), p.55-63 |
---|---|
Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 63 |
---|---|
container_issue | 8 |
container_start_page | 55 |
container_title | Electronics & communications in Japan. Part 2, Electronics |
container_volume | 81 |
creator | Emori, Akihiko Suzuki, Kunihiko Yukutake, Seigoh Ookuma, Sadayuki Mitumoto, Kinya Akioka, Takashi Iwamura, Masahiro Akiyama, Noboru |
description | This paper describes a high‐speed and low‐power 1‐Mbit BiCMOS cache SRAM sense circuit fabricated using a 0.5‐μm BiCMOS process technology. By using the quasi‐6 module structure, switching between 18‐ and 36‐bit output can be carried out without access delay. Because of the development of a sense circuit with a low‐amplitude current amplifier and equalization/write‐recovery circuit, the sense delay is 0.8 ns, which is 50% faster than the conventional common collector configuration. Using this new technique, a 1‐Mbit BiCMOS cache SRAM for 4.5‐ns cycle operation was fabricated. © 1998 Scripta Technica, Electron Comm Jpn Pt 2, 81(8): 55–63, 1998 |
doi_str_mv | 10.1002/(SICI)1520-6432(199808)81:8<55::AID-ECJB8>3.0.CO;2-0 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_27531199</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>27531199</sourcerecordid><originalsourceid>FETCH-LOGICAL-c3778-6d8f217d0794267dcde86b1f5096fea4a66921f099763b0e9016e12a26d62dab3</originalsourceid><addsrcrecordid>eNp9kMtuE0EQRVsIJEzCP8wKJYs2_XA_xkRIdidxjBwscJDZldo9NbiJX5m2RfL3mWGQNyBWJV1VHd06hFxw1uWMifdns7Ebn3MlGNU9Kc54nltmzy3v2wul-v3B-JJeuU9D-1F2WddNPwjKXpDO8eAl6VijNNVafn9N3qT0kzGWayU6ZHgTfyxp2iEWWcJNwizEKhziPttjWG7iwwFTVm6rzGecrhd1PozudjrLgg9LzGZfB7en5FXpVwnf_pkn5Nv11Z27oZPpaOwGExqkMZbqwpaCm4KZvCe0KUKBVi94qeomJfqe1zoXvGR5brRcMMwZ18iFF7rQovALeULetdxdtW1q7WEdU8DVym9we0ggjJK8VlMv3rWLodqmVGEJuyquffUEnEEjFKARCo0faPxAKxQsBwtKAdRC4bdQkMDATUEAk8e_fsUVPv3F_D_yX8Q2qLm05ca0x8cj11f3oI00CuafRzD60nMTO5-Dk8_RLJTG</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>27531199</pqid></control><display><type>article</type><title>High-speed sense circuit techniques for a 1-mbit BiCMOS cache SRAM</title><source>Wiley Online Library Journals Frontfile Complete</source><creator>Emori, Akihiko ; Suzuki, Kunihiko ; Yukutake, Seigoh ; Ookuma, Sadayuki ; Mitumoto, Kinya ; Akioka, Takashi ; Iwamura, Masahiro ; Akiyama, Noboru</creator><creatorcontrib>Emori, Akihiko ; Suzuki, Kunihiko ; Yukutake, Seigoh ; Ookuma, Sadayuki ; Mitumoto, Kinya ; Akioka, Takashi ; Iwamura, Masahiro ; Akiyama, Noboru</creatorcontrib><description>This paper describes a high‐speed and low‐power 1‐Mbit BiCMOS cache SRAM sense circuit fabricated using a 0.5‐μm BiCMOS process technology. By using the quasi‐6 module structure, switching between 18‐ and 36‐bit output can be carried out without access delay. Because of the development of a sense circuit with a low‐amplitude current amplifier and equalization/write‐recovery circuit, the sense delay is 0.8 ns, which is 50% faster than the conventional common collector configuration. Using this new technique, a 1‐Mbit BiCMOS cache SRAM for 4.5‐ns cycle operation was fabricated. © 1998 Scripta Technica, Electron Comm Jpn Pt 2, 81(8): 55–63, 1998</description><identifier>ISSN: 8756-663X</identifier><identifier>EISSN: 1520-6432</identifier><identifier>DOI: 10.1002/(SICI)1520-6432(199808)81:8<55::AID-ECJB8>3.0.CO;2-0</identifier><language>eng</language><publisher>New York: Wiley Subscription Services, Inc., A Wiley Company</publisher><subject>BiCMOS ; cache memory ; module ; sense amplifier ; SRAM ; write-recovery</subject><ispartof>Electronics & communications in Japan. Part 2, Electronics, 1998-08, Vol.81 (8), p.55-63</ispartof><rights>Copyright © 1998 Scripta Technica</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2F%28SICI%291520-6432%28199808%2981%3A8%3C55%3A%3AAID-ECJB8%3E3.0.CO%3B2-0$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2F%28SICI%291520-6432%28199808%2981%3A8%3C55%3A%3AAID-ECJB8%3E3.0.CO%3B2-0$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,27903,27904,45553,45554</link.rule.ids></links><search><creatorcontrib>Emori, Akihiko</creatorcontrib><creatorcontrib>Suzuki, Kunihiko</creatorcontrib><creatorcontrib>Yukutake, Seigoh</creatorcontrib><creatorcontrib>Ookuma, Sadayuki</creatorcontrib><creatorcontrib>Mitumoto, Kinya</creatorcontrib><creatorcontrib>Akioka, Takashi</creatorcontrib><creatorcontrib>Iwamura, Masahiro</creatorcontrib><creatorcontrib>Akiyama, Noboru</creatorcontrib><title>High-speed sense circuit techniques for a 1-mbit BiCMOS cache SRAM</title><title>Electronics & communications in Japan. Part 2, Electronics</title><addtitle>Electron. Comm. Jpn. Pt. II</addtitle><description>This paper describes a high‐speed and low‐power 1‐Mbit BiCMOS cache SRAM sense circuit fabricated using a 0.5‐μm BiCMOS process technology. By using the quasi‐6 module structure, switching between 18‐ and 36‐bit output can be carried out without access delay. Because of the development of a sense circuit with a low‐amplitude current amplifier and equalization/write‐recovery circuit, the sense delay is 0.8 ns, which is 50% faster than the conventional common collector configuration. Using this new technique, a 1‐Mbit BiCMOS cache SRAM for 4.5‐ns cycle operation was fabricated. © 1998 Scripta Technica, Electron Comm Jpn Pt 2, 81(8): 55–63, 1998</description><subject>BiCMOS</subject><subject>cache memory</subject><subject>module</subject><subject>sense amplifier</subject><subject>SRAM</subject><subject>write-recovery</subject><issn>8756-663X</issn><issn>1520-6432</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><recordid>eNp9kMtuE0EQRVsIJEzCP8wKJYs2_XA_xkRIdidxjBwscJDZldo9NbiJX5m2RfL3mWGQNyBWJV1VHd06hFxw1uWMifdns7Ebn3MlGNU9Kc54nltmzy3v2wul-v3B-JJeuU9D-1F2WddNPwjKXpDO8eAl6VijNNVafn9N3qT0kzGWayU6ZHgTfyxp2iEWWcJNwizEKhziPttjWG7iwwFTVm6rzGecrhd1PozudjrLgg9LzGZfB7en5FXpVwnf_pkn5Nv11Z27oZPpaOwGExqkMZbqwpaCm4KZvCe0KUKBVi94qeomJfqe1zoXvGR5brRcMMwZ18iFF7rQovALeULetdxdtW1q7WEdU8DVym9we0ggjJK8VlMv3rWLodqmVGEJuyquffUEnEEjFKARCo0faPxAKxQsBwtKAdRC4bdQkMDATUEAk8e_fsUVPv3F_D_yX8Q2qLm05ca0x8cj11f3oI00CuafRzD60nMTO5-Dk8_RLJTG</recordid><startdate>199808</startdate><enddate>199808</enddate><creator>Emori, Akihiko</creator><creator>Suzuki, Kunihiko</creator><creator>Yukutake, Seigoh</creator><creator>Ookuma, Sadayuki</creator><creator>Mitumoto, Kinya</creator><creator>Akioka, Takashi</creator><creator>Iwamura, Masahiro</creator><creator>Akiyama, Noboru</creator><general>Wiley Subscription Services, Inc., A Wiley Company</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>199808</creationdate><title>High-speed sense circuit techniques for a 1-mbit BiCMOS cache SRAM</title><author>Emori, Akihiko ; Suzuki, Kunihiko ; Yukutake, Seigoh ; Ookuma, Sadayuki ; Mitumoto, Kinya ; Akioka, Takashi ; Iwamura, Masahiro ; Akiyama, Noboru</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3778-6d8f217d0794267dcde86b1f5096fea4a66921f099763b0e9016e12a26d62dab3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><topic>BiCMOS</topic><topic>cache memory</topic><topic>module</topic><topic>sense amplifier</topic><topic>SRAM</topic><topic>write-recovery</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Emori, Akihiko</creatorcontrib><creatorcontrib>Suzuki, Kunihiko</creatorcontrib><creatorcontrib>Yukutake, Seigoh</creatorcontrib><creatorcontrib>Ookuma, Sadayuki</creatorcontrib><creatorcontrib>Mitumoto, Kinya</creatorcontrib><creatorcontrib>Akioka, Takashi</creatorcontrib><creatorcontrib>Iwamura, Masahiro</creatorcontrib><creatorcontrib>Akiyama, Noboru</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Electronics & communications in Japan. Part 2, Electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Emori, Akihiko</au><au>Suzuki, Kunihiko</au><au>Yukutake, Seigoh</au><au>Ookuma, Sadayuki</au><au>Mitumoto, Kinya</au><au>Akioka, Takashi</au><au>Iwamura, Masahiro</au><au>Akiyama, Noboru</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High-speed sense circuit techniques for a 1-mbit BiCMOS cache SRAM</atitle><jtitle>Electronics & communications in Japan. Part 2, Electronics</jtitle><addtitle>Electron. Comm. Jpn. Pt. II</addtitle><date>1998-08</date><risdate>1998</risdate><volume>81</volume><issue>8</issue><spage>55</spage><epage>63</epage><pages>55-63</pages><issn>8756-663X</issn><eissn>1520-6432</eissn><abstract>This paper describes a high‐speed and low‐power 1‐Mbit BiCMOS cache SRAM sense circuit fabricated using a 0.5‐μm BiCMOS process technology. By using the quasi‐6 module structure, switching between 18‐ and 36‐bit output can be carried out without access delay. Because of the development of a sense circuit with a low‐amplitude current amplifier and equalization/write‐recovery circuit, the sense delay is 0.8 ns, which is 50% faster than the conventional common collector configuration. Using this new technique, a 1‐Mbit BiCMOS cache SRAM for 4.5‐ns cycle operation was fabricated. © 1998 Scripta Technica, Electron Comm Jpn Pt 2, 81(8): 55–63, 1998</abstract><cop>New York</cop><pub>Wiley Subscription Services, Inc., A Wiley Company</pub><doi>10.1002/(SICI)1520-6432(199808)81:8<55::AID-ECJB8>3.0.CO;2-0</doi><tpages>9</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 8756-663X |
ispartof | Electronics & communications in Japan. Part 2, Electronics, 1998-08, Vol.81 (8), p.55-63 |
issn | 8756-663X 1520-6432 |
language | eng |
recordid | cdi_proquest_miscellaneous_27531199 |
source | Wiley Online Library Journals Frontfile Complete |
subjects | BiCMOS cache memory module sense amplifier SRAM write-recovery |
title | High-speed sense circuit techniques for a 1-mbit BiCMOS cache SRAM |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T16%3A24%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=High-speed%20sense%20circuit%20techniques%20for%20a%201-mbit%20BiCMOS%20cache%20SRAM&rft.jtitle=Electronics%20&%20communications%20in%20Japan.%20Part%202,%20Electronics&rft.au=Emori,%20Akihiko&rft.date=1998-08&rft.volume=81&rft.issue=8&rft.spage=55&rft.epage=63&rft.pages=55-63&rft.issn=8756-663X&rft.eissn=1520-6432&rft_id=info:doi/10.1002/(SICI)1520-6432(199808)81:8%3C55::AID-ECJB8%3E3.0.CO;2-0&rft_dat=%3Cproquest_cross%3E27531199%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=27531199&rft_id=info:pmid/&rfr_iscdi=true |