Does the ESD-failure current obtained by transmission-line pulsing always correlate to human body model tests?

Two different technologies serve as examples that the degree of correlation between ESD-failure currents obtained by transmission-line pulsing (TLP) and human body model (HBM) is a matter of the technology under investigation. Stressing a device with HBM or TLP can lead to different failure modes an...

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Veröffentlicht in:	Microelectronics and reliability 1998-11, Vol.38 (11), p.1773-1780
Hauptverfasser:	Stadler, W, Guggenmos, X, Egger, P, Gieser, H, Musshoff, C
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Electronics Exact sciences and technology Testing, measurement, noise and reliability
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description	Two different technologies serve as examples that the degree of correlation between ESD-failure currents obtained by transmission-line pulsing (TLP) and human body model (HBM) is a matter of the technology under investigation. Stressing a device with HBM or TLP can lead to different failure modes and, as a consequence, to a miscorrelation between the two test methods. Optimising a technology or a protection device only by means of TLP can easily lead to false conclusions.
doi_str_mv	10.1016/S0026-2714(98)00180-2
format	Article
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subjects	Applied sciences Electronics Exact sciences and technology Testing, measurement, noise and reliability
title	Does the ESD-failure current obtained by transmission-line pulsing always correlate to human body model tests?
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