Does the ESD-failure current obtained by transmission-line pulsing always correlate to human body model tests?

Two different technologies serve as examples that the degree of correlation between ESD-failure currents obtained by transmission-line pulsing (TLP) and human body model (HBM) is a matter of the technology under investigation. Stressing a device with HBM or TLP can lead to different failure modes an...

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Veröffentlicht in:Microelectronics and reliability 1998-11, Vol.38 (11), p.1773-1780
Hauptverfasser: Stadler, W, Guggenmos, X, Egger, P, Gieser, H, Musshoff, C
Format: Artikel
Sprache:eng
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Zusammenfassung:Two different technologies serve as examples that the degree of correlation between ESD-failure currents obtained by transmission-line pulsing (TLP) and human body model (HBM) is a matter of the technology under investigation. Stressing a device with HBM or TLP can lead to different failure modes and, as a consequence, to a miscorrelation between the two test methods. Optimising a technology or a protection device only by means of TLP can easily lead to false conclusions.
ISSN:0026-2714
1872-941X
DOI:10.1016/S0026-2714(98)00180-2