Dry etch improvements in the SOI wafer flow process for IPL stencil mask fabrication

The 4x Ion Projection Lithography (IPL), which is designed to reach sub 100nm resolution on the wafer plane, uses stencil membrane masks out of 150mm SOI (Silicon On Insulator) wafers [1]. The structured circular membranes have a diameter of 126mm and a thickness of 3μm. Results of a new sub-quarter...

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Veröffentlicht in:Microelectronic engineering 2000-06, Vol.53 (1), p.609-612
Hauptverfasser: Letzkus, F., Butschke, J., Höfflinger, B., Irmscher, M., Reuter, C., Springer, R., Ehrmann, A., Mathuni, J.
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container_end_page 612
container_issue 1
container_start_page 609
container_title Microelectronic engineering
container_volume 53
creator Letzkus, F.
Butschke, J.
Höfflinger, B.
Irmscher, M.
Reuter, C.
Springer, R.
Ehrmann, A.
Mathuni, J.
description The 4x Ion Projection Lithography (IPL), which is designed to reach sub 100nm resolution on the wafer plane, uses stencil membrane masks out of 150mm SOI (Silicon On Insulator) wafers [1]. The structured circular membranes have a diameter of 126mm and a thickness of 3μm. Results of a new sub-quarter micron trench etch and membrane dry etch process are presented and discussed.
doi_str_mv 10.1016/S0167-9317(00)00388-9
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subjects Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Lithography, masks and pattern transfer
Microelectronic fabrication (materials and surfaces technology)
Microelectronics: LSI, VLSI, ULSI
integrated circuit fabrication technology
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
title Dry etch improvements in the SOI wafer flow process for IPL stencil mask fabrication
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