An analysis of the influence of crystallographic texture on residual stress estimation for metallic films and coatings

A theoretical analysis of crystallographic texture and its influence on the accuracy of residual stress estimation by x-ray diffraction was performed. Two types of possible crystallographic texture were considered: sharp and scattered. The derived equations were applied to the investigation by x-ray diffraction of residual stresses in thermally-sprayed metallic coatings, which tend to form texture during their formation and growth. Cu M135 and Fe M50 were sprayed onto mild steel substrates.