A COST 240 benchmark test for beam propagation methods applied to an electrooptical modulator based on surface plasmons

Modeling of a waveguide polymer electrooptic (EO) modulator based on a resonant excitation of surface plasmons was used as a benchmark test for several beam propagation methods (BPMs). Wave-optical analysis of the structure is presented, and the results of four implementations of three numerical mod...

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Veröffentlicht in:	Journal of lightwave technology 1998-10, Vol.16 (10), p.1921-1927
Hauptverfasser:	Hoekstra, H.J.W.M., Lambeck, P.V., Krijnen, G.J.M., Ctvroky, J., De Minicis, H., Sibilia, C., Conradi, O., Helfert, S., Pregla, R.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Benchmark testing Circuit properties Costs Electric, optical and optoelectronic circuits Electronics Electrooptic modulators Electrooptical waveguides Exact sciences and technology Integrated optics. Optical fibers and wave guides Numerical models Optical and optoelectronic circuits Optical modulation Optoelectronic devices Plasmons Polymers Resonance Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Surface waves
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Beschreibung
Zusammenfassung:	Modeling of a waveguide polymer electrooptic (EO) modulator based on a resonant excitation of surface plasmons was used as a benchmark test for several beam propagation methods (BPMs). Wave-optical analysis of the structure is presented, and the results of four implementations of three numerical modeling methods are mutually compared and discussed.
ISSN:	0733-8724 1558-2213
DOI:	10.1109/50.721081