Nanoscale topography and tribological problems

Describes the use of scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) for roughness measurement of tribological surfaces down to nanometre scale.

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Bibliographische Detailangaben
Veröffentlicht in:	Tribology international 1995-02, Vol.28 (1), p.39-43
Hauptverfasser:	Myshkin, N.K., Chizhik, S.A., Gorbunov, V.V.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Exact sciences and technology Friction, wear, lubrication Machine components Mechanical engineering. Machine design Precision engineering, watch making
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	Describes the use of scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) for roughness measurement of tribological surfaces down to nanometre scale.
ISSN:	0301-679X 1879-2464
DOI:	10.1016/0301-679X(95)99492-4