Observation of 3-Fold Periodicity in 3C-SiC Layers Grown by MBE

Observation of 3-Fold Periodicity in 3C-SiC Layers Grown by MBE

High-resolution TEM images of 3C-SiC layers grown on SiC (0001) substrates by solid-source MBE at different growth conditions often reveal regions of material exhibiting an unusual threefold periodicity. Such regions always seem to be associated with twins and stacking faults within the layer. We co...

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Veröffentlicht in:Materials science forum 1998-01, Vol.264-268, p.259-264
Hauptverfasser: Richter, W., Kaiser, Ute, Chuvilin, A., Khodos, Igor I., Brown, P.D., Fissel, Andreas, Preston, A., Humphreys, Colin J.
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Sprache:eng
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Zusammenfassung:High-resolution TEM images of 3C-SiC layers grown on SiC (0001) substrates by solid-source MBE at different growth conditions often reveal regions of material exhibiting an unusual threefold periodicity. Such regions always seem to be associated with twins and stacking faults within the layer. We consider two different models which can match this threefold periodicity. (Author)
ISSN:0255-5476
1662-9752
1662-9752
DOI:10.4028/www.scientific.net/MSF.264-268.259