X-ray photoelectron spectra of Cu-GeO2 thin films prepared by vacuum co-evaporation

The atomic composition of thin films of Cu-GeO2 was studied using XPS, an important technique for characterising thin metal/insulator films. It is also able to provide information about the oxidation state of the metal and plasmon energies. Measurement of plasmon energies is very important because o...

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Veröffentlicht in:	Journal of materials science letters 1997, Vol.16 (18), p.1477-1479
Hauptverfasser:	LUCY, I. B, BEYNON, J, ORTON, B
Format:	Artikel
Sprache:	eng
Schlagworte:	Adsorbed layers and thin films Composition and phase identification Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Electron and ion emission by liquids and solids impact phenomena Electron states and collective excitations in multilayers, quantum wells, mesoscopic, and nanoscale systems Electron states and collective excitations in thin films, multilayers, quantum wells, mesoscopic and nanoscale systems Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Photoemission and photoelectron spectra Physics Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology
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Zusammenfassung:	The atomic composition of thin films of Cu-GeO2 was studied using XPS, an important technique for characterising thin metal/insulator films. It is also able to provide information about the oxidation state of the metal and plasmon energies. Measurement of plasmon energies is very important because of their relationship to the electronic structure of the material under investigation. 8 refs.
ISSN:	0261-8028
DOI:	10.1023/A:1018502603764