Laboratory-scale X-ray absorption spectroscopy of 3d transition metals in inorganic thin films

In this paper we present laboratory-scale X-ray absorption spectroscopy applied to the research of nanometer-scale thin films. We demonstrate the Cu K edge X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) of CuI and CuO thin films grown with atomic layer deposition. Film thicknesses in the investigated samples ranged from 12 to 248 nm. Even from the thinnest films, XANES spectra can be obtained in 5-20 minutes and EXAFS in 1-4 days. In order to prove the capability of laboratory-based XAS for in situ measurements on thin films, we demonstrate an experiment on in situ oxidation of a 248 nm thick CuI film at a temperature of 240 °C. These methods have important implications for novel and enhanced possibilities for inorganic thin film research. Ex-situ and in-situ x-ray absorption near edge spectroscopy (XANES) and ex-situ extended x-ray absorption fine structure (EXAFS) studies of CuI and CuO thin films with laboratory-scale X-ray absorption spectrometer in fluorescence mode.