Structural investigation of Pt-Al sub 2 O sub 3 co-sputtered nano-cermet films studied by small angle x-ray scattering, grazing angle x-ray reflectometry, TEM and AFM

The physical properties of nanocermets are related mostly to their morphology. In this contribution, we present the microstructural and morphological evolution of co-sputtered Pt-Al sub 2 O sub 3 granular films with thickness, metal concentrational and thermal annealing. These investigations are ach...

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Veröffentlicht in:Surface & coatings technology 1997-12, Vol.97 (1-3), p.603-610
Hauptverfasser: Sella, C, Maaza, M, Pardo, B, Dunsteter, F, Martin, J C, Sainte Catherine, M C, Kaba, A
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Sprache:eng
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Zusammenfassung:The physical properties of nanocermets are related mostly to their morphology. In this contribution, we present the microstructural and morphological evolution of co-sputtered Pt-Al sub 2 O sub 3 granular films with thickness, metal concentrational and thermal annealing. These investigations are achieved by grazing angle X-ray reflectometry (GAXR), small angle X-ray scattering (SAXS), transmission electron microscopy and atomic force microscopy. The experimental results show that: (1) the diameter of platinum nanoparticles increases as a function of film thickness, annealing temperature and metal concentration: and (2) a columnar growth is observed whose morphology is depending also on the previous parameters and on the growth direction. Substrates included stainless steel.
ISSN:0257-8972