Surface structure determination from ion scattering images

Spatial- and time-resolved, element-specific images which represent real-space projections of the interatomic vectors in a surface have been obtained for kiloelectron-volt scattered He and Ar and recoiled Pt atoms from Pt{111}. Spatial-dispersion results from blocking and focusing by “atomic lenses”...

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Veröffentlicht in:Surface science 1997-10, Vol.388 (1), p.L1085-L1091
Hauptverfasser: Kim, C., Höfner, C., Rabalais, J.W.
Format: Artikel
Sprache:eng
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Zusammenfassung:Spatial- and time-resolved, element-specific images which represent real-space projections of the interatomic vectors in a surface have been obtained for kiloelectron-volt scattered He and Ar and recoiled Pt atoms from Pt{111}. Spatial-dispersion results from blocking and focusing by “atomic lenses” into structure-sensitive patterns, forming the basis for a scattering and recoiling imaging spectrometry. The technique is coupled with classical ion trajectory simulations for determination of the Pt{111} surface relaxation for which previous low energy electron diffraction and ion scattering measurements have produced controversial results. Pt{111} has become a standard for surface science measurements, and accurate determination of its surface relaxation is important for use as a standard and for verifying and calibrating theories of relaxation and reconstruction.
ISSN:0039-6028
1879-2758
DOI:10.1016/S0039-6028(97)00521-9