Operation of electroluminescent porous silicon diodes as surface-emitting cold cathodes
Cold electron emission properties of porous silicon (PS) electroluminescent diodes have been investigated as a function of the top metal electrode thickness, surface work function, and the thickness of PS layer. It is shown that the best thicknesses for Pt and Au electrodes are 50∼80 Å. The emission...
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Veröffentlicht in: | Thin solid films 1997-04, Vol.297 (1), p.314-316 |
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Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Cold electron emission properties of porous silicon (PS) electroluminescent diodes have been investigated as a function of the top metal electrode thickness, surface work function, and the thickness of PS layer. It is shown that the best thicknesses for Pt and Au electrodes are 50∼80 Å. The emission is enhanced by introducing an Al–Mg alloy electrode with a relatively low work function. Although the emission efficiency and the threshold voltage show definite dependencies on the thickness of PS layer, the Fowler–Nordheim plots show a linear behavior in every case. The maximum emission current density and efficiency obtained in this study are 10 μA cm
−2 and 10
−3, respectively. |
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ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/S0040-6090(96)09475-8 |