X-Ray Measurement of Stress by Using Solid-State Semi-Conductor Detector

A stress analyzing instrument was developed based on the energy dispersive X-ray diffractometry. 4-point bending stress in steel specimens was tried to measure by using the side-inclination method. It was found that the energy-sin2ψ (En-sin2ψ) diagram, which corresponds to 2θ-sin2ψ in the side-inclination method, showed good linearity and accuracy as same as the conventional method. The relationship between the mechanically determined stress and X-ray determined stress was also linear. In conclusion, this method is useful to stress measurement.