The characterization of passive films on chromium electrodes by XPS

The characterization of passive films on chromium electrodes by XPS

The passivity of chromium has been investigated in aqueous H 2SO 4 solutions (1, 8 and 18 M) and anhydrous systems H 2SO 4-formamide. An X-ray photo-electron spectroscopy analysis of passive layers demonstrates that oxide-hydroxide films are formed on chromium in these conditions. The anodic film fo...

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Veröffentlicht in:Corrosion science 1994-12, Vol.36 (12), p.2159-2167
Hauptverfasser: Stypula, B., Stoch, J.
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Corrosion
Corrosion mechanisms
Exact sciences and technology
Metals. Metallurgy
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Zusammenfassung:The passivity of chromium has been investigated in aqueous H 2SO 4 solutions (1, 8 and 18 M) and anhydrous systems H 2SO 4-formamide. An X-ray photo-electron spectroscopy analysis of passive layers demonstrates that oxide-hydroxide films are formed on chromium in these conditions. The anodic film formed in concentrated and anhydrous solutions of H 2SO 4 contains sulphur species in lower oxidation states (e.g. S 2). The presence of these species shows that in these solutions H 2SO 4 and/or its anions acts in the passivation process as an oxidation agent.
ISSN:0010-938X
1879-0496
DOI:10.1016/0010-938X(94)90014-0