5f covalency from x-ray resonant Raman spectroscopy

X-ray resonant Raman spectroscopy (XRRS), a variant of resonant inelastic x-ray scattering, has been used to investigate the two prototype systems, UF 4 and UO 2 . Both are U5f 2 and each is an example of 5f localized, ionic behavior and 5f localized, covalent behavior, respectively. From the M 5 XR...

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Veröffentlicht in:Journal of physics. Condensed matter 2022-12, Vol.34 (50), p.505601
Hauptverfasser: Tobin, J G, Nowak, S, Yu, S-W, Alonso-Mori, R, Kroll, T, Nordlund, D, Weng, T-C, Sokaras, D
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Sprache:eng
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Zusammenfassung:X-ray resonant Raman spectroscopy (XRRS), a variant of resonant inelastic x-ray scattering, has been used to investigate the two prototype systems, UF 4 and UO 2 . Both are U5f 2 and each is an example of 5f localized, ionic behavior and 5f localized, covalent behavior, respectively. From the M 5 XRRS measurements, the 5f band gap in each can be directly determined and, moreover, a clear and powerful sensitivity to 5f covalency emerges.
ISSN:0953-8984
1361-648X
DOI:10.1088/1361-648X/ac9bbd