Influence of the aminated conditions on the pH sensitivity of silica and amorphous silicon film

Silicon nitride has been widely used as a pH sensitive membrane of the ion sensitive field effect transistor (ISFET) thanks to the high reactivity of the SiNH 2 sites to the H + ions. In this paper, we report experimental results on the H + sensitivity of silica and amorphous silicon aminated films,...

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Veröffentlicht in:Journal of the European Ceramic Society 1997, Vol.17 (15), p.2021-2024
Hauptverfasser: Baccar, Z.M., Jaffrezic-Renault, N., Fourmond, E., Lemiti, M., Grekov, F.F.
Format: Artikel
Sprache:eng
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Zusammenfassung:Silicon nitride has been widely used as a pH sensitive membrane of the ion sensitive field effect transistor (ISFET) thanks to the high reactivity of the SiNH 2 sites to the H + ions. In this paper, we report experimental results on the H + sensitivity of silica and amorphous silicon aminated films, obtained by the photo-CVD. We have studied the dependence of their response to pH as a function of the time and the temperature of amination of the film. The response of the aminated films (silica and amorphous silicon) is quasi-Nernstianfor amination exposure time higher than 1 min, deposited at temperature lower than 200 °C. A theoretical model of deposition is presented. It can explain the influence of the deposition conditions.
ISSN:0955-2219
1873-619X
DOI:10.1016/S0955-2219(97)00052-6