High-resolution, wavefront-sensing, full-field polarimetry of arbitrary beams using phase retrieval

Recent advances in structured illumination are enabling a wide range of applications from imaging to metrology, which can benefit from advanced beam characterization techniques. Solving uniquely for the spatial distribution of polarization in a beam typically involves the use of two or more polariza...

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Veröffentlicht in:Optics express 2022-07, Vol.30 (15), p.27967-27982
Hauptverfasser: Jacobs, Matthew N., Esashi, Yuka, Jenkins, Nicholas W., Brooks, Nathan J., Kapteyn, Henry C., Murnane, Margaret M., Tanksalvala, Michael
Format: Artikel
Sprache:eng
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Zusammenfassung:Recent advances in structured illumination are enabling a wide range of applications from imaging to metrology, which can benefit from advanced beam characterization techniques. Solving uniquely for the spatial distribution of polarization in a beam typically involves the use of two or more polarization optics, such as a polarizer and a waveplate, which is prohibitive for some wavelengths outside of the visible spectrum. We demonstrate a technique that circumvents the use of a waveplate by exploiting extended Gerchberg–Saxton phase retrieval to extract the phase. The technique enables high-resolution, wavefront-sensing, full-field polarimetry capable of solving for both simple and exotic polarization states, and moreover, is extensible to shorter wavelength light.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.461658