A simpler method for life-testing laser diodes
The procedure of measuring the I(V) characteristics of laser diodes at fixed time steps of a constant current life-test is revised. The possibility of using the test equipment itself to extract the characteristics is investigated and demonstrated. This eliminates the most troublesome manual procedur...
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| Veröffentlicht in: | Microelectronics and reliability 1999, Vol.39 (6), p.1067-1071 |
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| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | The procedure of measuring the I(V) characteristics of laser diodes at fixed time steps of a constant current life-test is revised. The possibility of using the test equipment itself to extract the characteristics is investigated and demonstrated. This eliminates the most troublesome manual procedure in life-testing several devices. |
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| ISSN: | 0026-2714 1872-941X |
| DOI: | 10.1016/S0026-2714(99)00148-1 |