Strain mapping by diffraction imaging

A novel method applying a micro-channel plate as collimator in front of a position sensitive detector (CCD-camera) allows the imaging of large areas (approx =1 cm exp 2 ) of polycrystalline materials using the diffracted radiation. Using this set-up the spatially resolved intensity of selected reflections can be measured with exposure times in the order of seconds. This method has successfully been applied to study lattice spacing and orientation as function of position in the specimen in order to reveal the influence of the surrounding and the impact of processing parameters. Materials studied: polypropylene, copper and potassium-doped tungsten wire.