Iron pyrite thin film prepared by double source vacuum vapor deposition

Iron pyrite thin films were prepared using a double-source evaporation method at high partial pressure and high temperature. The thickness of the films were measured by scanning electron microscopy and was in the range of 0.1-0.5 mu m, depending on the vaporization time. The characteristics of the deposited films were examined by thin film X-ray diffraction and Raman spectroscopies.