Potentiometric and magnetic force microscopy in multilayers

The simultaneous collection of magnetic, topographic and potentiometric data has been achieved using a modified magnetic force microscope (MFM). Use of a reference sample confirmed that there was no interference between magnetic and potentiometric channels. Images of domain walls and of the surface...

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Veröffentlicht in:	Journal of magnetism and magnetic materials 1999-06, Vol.198, p.95-97
Hauptverfasser:	Slade, M.A, Valera, M.S, Lambrick, D.B, Hoon, S.R, Farley, A.N, Holloway, H, Kubinski, D.J
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology GMR Instruments, apparatus, components and techniques common to several branches of physics and astronomy Interfacial magnetic properties (multilayers, magnetic quantum wells, superlattices, magnetic heterostructures) Magnetic force microscopes Magnetic properties and materials Magnetic properties of surface, thin films and multilayers Metals. Metallurgy MFM Physics Scanning probe microscopes, components and techniques SPM Surface potential
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Beschreibung
Zusammenfassung:	The simultaneous collection of magnetic, topographic and potentiometric data has been achieved using a modified magnetic force microscope (MFM). Use of a reference sample confirmed that there was no interference between magnetic and potentiometric channels. Images of domain walls and of the surface potential in a Co/Cu multilayer system have been obtained. Domain walls observed are consistent with those obtained using conventional MFM whilst potentiometry revealed a constant background with small areas of higher or lower potential.
ISSN:	0304-8853
DOI:	10.1016/S0304-8853(98)00635-0