Dielectric characterization of the lone pair oxide structure

Dielectric characterization of the lone pair oxide structure

Dielectric and photodielectric studies of Pb 3O 4 layers are presented. The dielectric relaxation process and the increase of capacitance with illumination were revealed. The mechanisms of dielectric polarization are discussed. The probable influence of the lone pair electrons belonging to the Pb 2+...

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Veröffentlicht in:Journal of non-crystalline solids 2002-07, Vol.305 (1), p.136-139
Hauptverfasser: Avanesyan, V.T, Bordovskii, V.A, Potachev, S.A
Format: Artikel
Sprache:eng
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Zusammenfassung:Dielectric and photodielectric studies of Pb 3O 4 layers are presented. The dielectric relaxation process and the increase of capacitance with illumination were revealed. The mechanisms of dielectric polarization are discussed. The probable influence of the lone pair electrons belonging to the Pb 2+ cations on dielectric and photodielectric properties is considered.
ISSN:0022-3093
1873-4812
DOI:10.1016/S0022-3093(02)01090-6