Properties of films of multilayered ZnO: Al and ZnO deposited by an alternating sputtering method

A multilayered film of ZnO:Al and ZnO was prepared by alternating sputtering in Ar gas, and the influence on electrical properties of ZnO layers, inserted between ZnO:Al layers, was examined. Both the carrier concentration and the Hall mobility were increased. The data show that some carrier electro...

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Veröffentlicht in:Thin solid films 1999, Vol.343, p.160-163
Hauptverfasser: Tominaga, K., Murayama, T., Umezu, N., Mori, I., Ushiro, T., Moriga, T., Nakabayashi, I.
Format: Artikel
Sprache:eng
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Zusammenfassung:A multilayered film of ZnO:Al and ZnO was prepared by alternating sputtering in Ar gas, and the influence on electrical properties of ZnO layers, inserted between ZnO:Al layers, was examined. Both the carrier concentration and the Hall mobility were increased. The data show that some carrier electrons now move in the undoped ZnO layer and that the film crystallinity was improved in the multilayered film deposition.
ISSN:0040-6090
1879-2731
DOI:10.1016/S0040-6090(98)01653-8